| 摘要 |
A semiconductor integrated circuit which includes therein at least one inspection circuit for inspecting a voltage level produced at an internal node to be inspected. The inspection circuit has at least a control signal input portion connected to the internal node to be inspected and an input part connected to an external input/output pin. The inspection circuit includes a series-connected transistor and diode connected between a power source and the input portion, a capacitor connected between a gate of the transistor and the input portion, and a transfer gate transistor connected between the control signal input portion and the gate of the transistor. The inspection circuit discriminates the level at the internal node according to a flow or nonflow of a current, via the external input/output pin, when a particular signal having a voltage level higher than the power source level is supplied to the external input/output pin. |
