发明名称 Sine-bar gage-blocks and direct reading micrometer adjustment
摘要 A set of selectively useable primary gage-blocks displacing plugs of a first sine-bar at increasing degree ranges of angularity, and selectively useable secondary gage-blocks for disposition between a primary block and displaced sine-bar plug for the increase in angularity to degree increments within said primary block range, and combined therewith a second sine-bar and directly reading micrometer adjustment for angular displacement of the secondary sine-bar in degrees and minutes of angularity, the micrometer being comprised of a barrel having a curvilinear index line with axial calibration in degrees and displaced from rotation of an extension screw of uniform pitch, and a thimble with circumferential calibrations in minutes and rotating with the said extension screw to be revolved in reference to said curvilinear index line and thereby extended in decreasing amounts corresponding to the height dimensions required in order to establish sine-bar angularity.
申请公布号 US4389785(A) 申请公布日期 1983.06.28
申请号 US19800216657 申请日期 1980.12.15
申请人 GOLDSMITH, WESELY R.;DI MARCO, JOEL E. 发明人 GOLDSMITH, WESELY R.;DI MARCO, JOEL E.
分类号 G01B5/24;(IPC1-7):G01B3/18;G01B3/30 主分类号 G01B5/24
代理机构 代理人
主权项
地址