| 摘要 |
A device for checking the quality of a knife 3 in a microtome, in particular an ultramicrotome, in which the microtome has an observation microscope 4 and a sublevel light source 6 for illuminating a specimen/ knife region, the knife being carried by a knife-holder 12, which can be pivoted about an axis lying along the cutting edge of the knife between a specimen-cutting position and a tilted position in which the exposed surface of the cutting edge of the knife and the optical path of the sublevel light source define an included angle of at least 20 DEG . The knife-holder can be locked in this tilted position. <IMAGE> |
