发明名称 SUBSTRATE FOR SEMICONDUCTOR DEVICE
摘要 PURPOSE:To obtain the substrate for mounting of the semiconductor element having superior heat radiation by a method wherein a film consisting of an organic matter having the electrically insulating property and moreover having comparatively favorable thermal conductivity is coated as a thin layer on the surface of a tape of metal, alloy or composite thereof having favorable thermal conductivity. CONSTITUTION:The metal substrate 1 for mounting of the Si semiconductor element 6 and coated with the SiC thin film 4 is manufactured according to the plasma CVD method, and copper of 1.0mm. thickness and containing Zr is used for the metal substrate 1. The plasma CVD method is performed using a capacitive coupling type glow discharge device and mixed gas of 1X10<-2> Torr of SiH4 and CH4, and by heating the substrate at 500 deg.C. Accordingly the substrate 3 for mounting of the semiconductor coated with the SiC thin film 4 of 3mum thickness having favorable adhesion, having the dielectric strength characteristic of 3MV/ cm or more, having the coefficient of thermal expansion approximated to the Si element to be mounted and having superior heat radiation is obtained.
申请公布号 JPS58103156(A) 申请公布日期 1983.06.20
申请号 JP19810203159 申请日期 1981.12.15
申请人 SUMITOMO DENKI KOGYO KK 发明人 MATSUMURA AKIRA;OGASA NOBUO;OOTSUKA AKIRA
分类号 H01L21/52;H01L21/58;H01L23/14;H01L23/373 主分类号 H01L21/52
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