发明名称 X RAY SPECTROSCOPY
摘要 PURPOSE:To measure the wavelength and the intensity of X ray in a wide range by measuring the kinetic energy and quantity of photoelectrons released from a target comprising lithium and the like when X ray to be measured irradiates the target. CONSTITUTION:X ray 1 to be measured irradiates a target 2 comprising lithium and the like. Photoelectron 3 released from the target 2 enter a kinetic energy discriminator 4 for photoelectrons. When the X ray 1 contains various frequencies, the kinetic energy of the photoelectrons gives various values. When the photoelectrons 3 are introduced into the discriminator 4 to plot a relationship between the kinetic energy and the quantity of the photoelectrons, a relationship is determined between the wavelength and the intensity of the X ray. Beryllium, boron and carbon are used for the target in addition to lithium.
申请公布号 JPS58102178(A) 申请公布日期 1983.06.17
申请号 JP19810201383 申请日期 1981.12.14
申请人 NIPPON DENSHIN DENWA KOSHA 发明人 NAGAI KAZUTOSHI;OKADA IKUO
分类号 G01T1/36;G01N23/00;G01N23/227 主分类号 G01T1/36
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