Test adapter for providing contact between flat electronics modules (circuit boards) to be tested and a universal test instrument

摘要

The test adapter consists of several levels, is assembled of uniformly structured parts and is designed especially for a particular type of flat modules to be tested. At the bottom level of the test adapter, sockets are arranged via which, when the test adapter is attached to the universal test instrument by means of a pneumatically driven coupling device, electrical connections are first established between the universal test instrument and the test adaptor. These contact sockets are individually wired with contact pins which are inserted in the top level, accurately corresponding to the circuit points located on the flat module, to which the contact is to be established.