发明名称 METHOD FOR CHECKING LSI
摘要 PURPOSE:To enable to monitor the function of an inside gate of the LSI according to the plural ways and moreover rapidly only by adding one pin by a method wherein the checking function of the inside gate and the function at normal use are made to be provided to the pin. CONSTITUTION:A signal s of the inside gate intending to be outputted is inputted into a tri-state output buffer circuit 1, and when a change-over signal H is outputted from an outside terminal 6 for change-over, a check signal is generated as output at an outside terminal 5 for common use of the check signal/a normal signal, and can be confirmed. Moreover when a change-over signal L is outputted from the outside terminal 6 for change-over, the tri-state buffer circuit 1 is made to be in the high impedance condition, and the normal signal inputted from the outside terminal 5 for common use can be obtained from the output terminal of an AND gate circuit 3 through an input buffer circuit 2.
申请公布号 JPS58100437(A) 申请公布日期 1983.06.15
申请号 JP19810197748 申请日期 1981.12.10
申请人 OKI DENKI KOGYO KK 发明人 NAKAMURA FUMIO;KATSUMATA KIYOSHI
分类号 H01L21/66;G01R31/28;H01L21/822;H01L27/04 主分类号 H01L21/66
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