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经营范围
发明名称
MEHRKRISTALLDIFFRAKTOMETER INSBESONDERE ZUR ROENTGEN-UND NEUTRONENBEUGUNGSUNTERSUCHUN7 MIT SEHR HOHER AUFLOESUNG
摘要
申请公布号
DD137279(B1)
申请公布日期
1983.06.15
申请号
DD19780206073
申请日期
1978.06.19
申请人
发明人
分类号
G01N23/20
主分类号
G01N23/20
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