发明名称 MEASURING APPARATUS FOR POLISHED DEGREE OF RISE GRAIN
摘要 PURPOSE:To make it possible to accurately measure the polished degree of rice grains with a simple operation, by measuring the quantity of the light reflected by a sample polished rice and the quantity of the light transmitted thereby, and adding the whole light quantities while making a correction according to the kinds or a correction according to the difference between the quantity of the light transmitted by polished rice and the quantity of the light transmitted by unpolished rice. CONSTITUTION:The light from a light-source lamp 5 is passed through a heat-ray absorbing filter, a monochromatic filter, a condenser lens and an integrating sphere having its inner surface defined as a mirror and is then applied to a sample flow path. When sample grains flowing in the sample flow path from a sample tank is regulated so as to have a proper density, in response to a signal from a flow path resistance regulator, the transmissivity and reflectance of the polished rice are measured by a transmitted light-receiving element 15A and a reflected light-receiving element 15B, respectively. The signals therefrom are fed into an adder 27 through detecting circuits 16, 17, respectively, together with a correction value H from a circuit 31 for making corrections according to quality. In the adder 27, the polished degree =alpha.the reflected light quantity+beta.the transmitted light quantity+H is calculated and displayed on a polished-degree display 32.
申请公布号 JPS5899735(A) 申请公布日期 1983.06.14
申请号 JP19810197959 申请日期 1981.12.08
申请人 SATAKE SEISAKUSHO:KK 发明人 SATAKE TOSHIHIKO
分类号 G01N21/85;B02B7/00;B07C5/342;G01N21/59;G01N33/10 主分类号 G01N21/85
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