发明名称 |
Target for calibrating and testing infrared detection devices |
摘要 |
Apparatus for calibrating and testing infrared detection devices is provided. The apparatus comprises a substrate which supports a target pattern of dielectric material which is at least partially absorbing to infrared radiation. A heater is used to supply heat to the substrate. Since the substrate and dielectric material have different emissivities, an apparent temperature difference is perceived by an IR detection device. As a consequence, temperature differences as low as about 0.02 DEG C. and below can be generated for calibrating and testing IR imaging devices.
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申请公布号 |
US4387301(A) |
申请公布日期 |
1983.06.07 |
申请号 |
US19810255966 |
申请日期 |
1981.04.20 |
申请人 |
HUGHES AIRCRAFT COMPANY |
发明人 |
WIRICK, MICHAEL P.;WRIGHT, JAMES P. |
分类号 |
F41J2/02;G01J5/52;H04N5/33;(IPC1-7):G01D18/00 |
主分类号 |
F41J2/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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