发明名称 FORMATION OF MICROMINIATURE PATTERN
摘要 PURPOSE:To improve accuracy of processings by forming a flat surface organic substance film to a material having a stepped part or dents or projected areas to be processed, forming an organic substance mask providing an inorganic substance film mask and by etching such material to be processed. CONSTITUTION:A photo resist 8 is rotatingly coated on an Al-Si alloy film 6 of MOSFET, such photo resist is exposed by ultra violet ray using a mask having thick and thin areas in accordance with high and low levels and developed. Thereby the surface is almost flattened. Then, an Al film 9 is vacuum deposited, a thin resist film 10 is formed and these are exposed and developed. Thereby, the surface becomes flat, Al 9 prevents disturbed reflection from the base material and a highly accurate mask can be obtained. The Al 9 is anisotropically etched by CCl4 and O2. Thereafter, the resist film 8 is etched by the gas mainly composed of O2, and Al-Si alloy 6 is etched by the gas mainly composed of CCl4. According to this constitution, a highly accurate pattern can be produced without deformation of pattern due to stepped parts and dent or projected portions of base material and without any disable resolution.
申请公布号 JPS5893236(A) 申请公布日期 1983.06.02
申请号 JP19810192162 申请日期 1981.11.30
申请人 TOKYO SHIBAURA DENKI KK 发明人 TOUKAWA IWAO
分类号 H01L21/302;H01L21/3065;H01L21/3213;(IPC1-7):01L21/302 主分类号 H01L21/302
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