| 摘要 |
PURPOSE:To perform a simple and rapid analysis of a metal with a high quantitative precision, by a method wherein, through secondary heating of a molten metal sample, a metallic fine particle sample is conveyed through a carrier gas to produce plasma flame in a spectroscopic analyzer. CONSTITUTION:An analysis sample 3, housed in a fire resistant crucible 4 in an enclosure cylinder tube of a fine particle producer 1, is fused by a high frequency heating. A fusing surface thereof is secondarily heated by a plasma gun 8 mounted within a range to a tilting angle of 45 deg. from a center to evaporate a metallic fine particle sample, and an quantitative determination of a fine particle is conveyed by a gas carrier to an emission spectroscopic analyzer 24 having a plasma exciting source via a conveyance gas distribution 20. Then, a plasma flame 27 is produced in the device 24. The constitution permits the simple and rapid analysis of a metal with a high quantitative precision. |
