| 摘要 |
PURPOSE:To automatically correct the flaw detecting gate of a probe for oblique flaw detection on the basis of actual thickness of a material to be detected which is measured with a probe for thickness measurement, by providing those probes for the oblique flaw detection and thickness measurement. CONSTITUTION:An oblique probe 1 projects an ultrasonic wave 8 in a circumferential direction of a pipe 5, and a probe 2 for thickness measurement projects an ultrasonic wave 9 toward the center part of the pipe. An echo received by the probe 2 is sent to S and B echo beam distance measuring circuits 13 and 14 to measure beam distance, and their outputs are sent to a thickness calculating circuit 16 to calculates the thickness. A thickness deviation circuit 17 calculates the difference between thickness set by a set input circuit 21 and actual measured thickness and sends the difference to a gate correcting circuit 19, and a gate is varied corresponding to the thickness corrected value sent from the thickness deviation circuit 17 and sent to a defect discriminating circuit 18. An echo received by the oblique probe 1 is sent to the circuit 18 to discriminate on an echo the gate correged by a gate correcting circuit 19 by a discrimination level. |
