发明名称 HIGH-PRECISE MEASURING METHOD FOR GROUP REFRACTIVE INDEX
摘要 PURPOSE:To perform an easy measurement of a group refractive index through a very simple means, by a method wherein an interference fringe due to a luminous flux of wavelengths lambda1, lambda2 is detected by a like detector, and based on the output of the detector, a group refractive index is found. CONSTITUTION:Laser lights from a laser light source 1 of a wavelength lambda1 and a laser light source 2 of a wavelength lambda2 are mixed by a beam mixing device 3. The lights are caused to enter an interference meter in a manner that the optical shafts are arranged in order. Each interference due to a luminous flux of wavelengths lambda1 and lambda2 is produced, and an interference fringe due to a luminous flux transmitting a vacuum cell 9 is reflected by a reflection mirror 11 to detect it by a detector 12. An interference fringe due to a flux not transmitting the cell 19 is detected by a detector 13. From a phase difference between the interference fringes, a group refraction index of air is found highly precisely.
申请公布号 JPS5887447(A) 申请公布日期 1983.05.25
申请号 JP19810186599 申请日期 1981.11.20
申请人 KOGYO GIJUTSUIN (JAPAN) 发明人 MATSUMOTO KOUICHI
分类号 G01N21/41;G01N21/45;(IPC1-7):01N21/45 主分类号 G01N21/41
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