| 摘要 |
PURPOSE:To perform a testing under the condition similar to the actual application by applying a D.C. bias and a power by an alternating current to internal elements with a means of running an alternating current from outside provided on an output terminal of a semiconductor amplifier while a D.C. bias is being applied. CONSTITUTION:A power source terminal 1 of a power IC6 is connected to a power source 8 with an earth terminal 3 grounded enabling the IC6. An output terminal 2 is connected to an output terminal 13 of an alternating current application device 11 through a load resistance 10 and a switch (S)7. At the terminal 13, this generates, for example, a sine wave output voltage 12 of about 1kHz oscillating centered on the potential equal to D.C. potential of the terminal 2. Upon the closing of the S7, an alternating current 15 with a voltage 12 and a resistance 10 flows separately to output transistors 4 and 5 of IC 6 at an interval of half cycle. Thus, the same power is applied as would be in the actual application. A power cycle testing can be done by interrupting the S7. The IC6 only requires connection to external parts necessary for gaining the D.C. bias, hence eliminating the need for parts to cause an A.C. action. |
