| 摘要 |
Built-in test apparatus is provided for testing the overall functional operation of a microprocessor system which has microprocessor, RAM, PROM, address latch, I/O, timer, multiple bus arbitration and other circuits in it. To the microprocessor system are added a pseudo-random pattern generator (PRPG), a signature register (SR), supplemental control logic, serial and parallel I/O port test logic and an LED display. The system PROM is programmed with test instructions. Test input data is provided by the test instructions and the PRPG. Test output data is processed by the SR and the system microprocessor, and the test results are presented on the display. |
