发明名称 CLEANING DEVICE FOR DETECTION CHAMBER IN MEASUREMENT DEVICE OF GRAIN POLISHING DEGREE
摘要 PURPOSE:To make it always possible to measure exactly the degree of grain polishing by installing a cleaner at the tip end of a measurement rod that is provided in the detection section chamber of a grain polishing measurement device with free entrance and exit and removing attached objects with the cleaner every time the measurement is made. CONSTITUTION:On the right side of an integration ball 1 a detection chamber 2 in which specimens flow and a light-receiving element 8 for light that passes through are provided, and below the ball 1 a light-receiving element 8' for reflected light, and on the left side a light source device that consists of a light source lamp 4, etc. Both wall faces of the chamber 2 are formed with quartz glass 18 and a measurement rod 20 at the tip end of which a cleaner 19 is provided is installed with free entrance into and exit from the chamber 2. When the degree of polishing is measured, the measurement rod 20 is inserted by a driving motor 23 and attached objects are cleaned by the cleaner 19, then a standard white plate 22 is inserted to set up the standard polishing by light-receiving elements 8 and 8'. Next, the degree of polishing is measured by means of a specified circuit. Accordingly, everytime the measurement is made, attached objects are removed, and the degree of polishing can be exactly measured.
申请公布号 JPS5879140(A) 申请公布日期 1983.05.12
申请号 JP19810176439 申请日期 1981.11.05
申请人 SATAKE SEISAKUSHO:KK 发明人 SATAKE TOSHIHIKO;HOSAKA YUKIO
分类号 G01N21/01;G01N21/15;(IPC1-7):01N21/15 主分类号 G01N21/01
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