发明名称 SEMICONDUCTOR DEVICE
摘要 PURPOSE:To provide high heat resistance, excellent reproducibility and characteristic stability by employing nitrided titanium having excellent diffusion preventing effect as a diffusion barrier layer. CONSTITUTION:In the function of each layer forming electrode, a layer 3 is a titanium itself or a contact layer for forming an ohmic contact or Schottky barrier with good reproducibility of titanium arsenide compound formed by heat treatment, a nitrided titanium layer 4 is a diffusion barrier layer for preventing the production of compound such as a platinum and arsenic, platinum and gallium or the like, a platinum layer 5 is an intermediate layer to be inserted to enhance the contact layer to the layer 4 of a gold layer 6, and the layer 6 is a conductor. In this manner, a diffusion barrier layer due to nitrided titanium is filled, thereby preventing the mutual reaction of the electrode metal and the semiconductor except the titanium, enhancing the heat resistance, and providing excellent characteristic reproducibility and stability.
申请公布号 JPS5875868(A) 申请公布日期 1983.05.07
申请号 JP19810172717 申请日期 1981.10.30
申请人 NIPPON DENSHIN DENWA KOSHA 发明人 KANAMORI SHIYUUICHI;MATSUMOTO TADASHI
分类号 H01L29/43;H01L21/28;H01L29/45;(IPC1-7):01L29/46 主分类号 H01L29/43
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