METHOD AND APPARATUS FOR INSPECTING LSI AND MEMORY DEVICE,申请号JP19820177474-传众专利搜索

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发明名称	METHOD AND APPARATUS FOR INSPECTING LSI AND MEMORY DEVICE
摘要
申请公布号	JPS5873100(A)	申请公布日期	1983.05.02
申请号	JP19820177474	申请日期	1982.10.08
申请人	TELEDYNE INC	发明人	JIYOOJI UIRIAMU KONAA
分类号	G11C29/00;G01R31/319;G06F11/22;G06F12/16;G11C29/56	主分类号	G11C29/00
代理机构		代理人
主权项
地址

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