发明名称 MANUFACTURE OF INFRARED RAY DETECTING ELEMENT
摘要 PURPOSE:To allow the effective utilization of the whole substrate without waste, by forming an electrode reaching the rear surface via the side surface of a compound semiconductor substrate and forming an anodic oxide film on the epitaxial layer of the substrate surface. CONSTITUTION:The epitaxial layer 1 is grown on the surface of the compound semiconductor substrate 2. Besides, the electrode for anodic oxidation 9 which is coupled to the layer 1 and reaches the back surface of the substrate 2 via the side surface of the substrate 2. This electrode 9 is coupled to the positive electrode of source side, and the negative electrode of the power source 4 is coupled to the negative electrode 6 for anodic oxidation. The substrate 2 and the electrode 6 are dipped into the solution for anodic oxidation 7. When positive potentials are impressed on the epitaxial layer 1 via the electrode 9 in this manner, an anodic oxide film 8 is formed over the entire surface of the layer 1. Thus, an anodic oxide film can be easily formed over the entire surface of the epitaxial layer 1 without damaging the surface cleaning effect on the epitaxial layer.
申请公布号 JPS5870582(A) 申请公布日期 1983.04.27
申请号 JP19810169535 申请日期 1981.10.22
申请人 FUJITSU KK 发明人 UEDA TOMOSHI;TAKIGAWA HIROSHI;YOSHIKAWA MITSUO;ITOU MICHIHARU;HAMASHIMA SHIGEKI
分类号 H01L31/10;H01L21/316 主分类号 H01L31/10
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