| 摘要 |
PURPOSE:To maintain a constant flaw detection precision, by a method wherein a surface wave echo detected by a probe is compared with a surface wave echo serving as a reference, and a sensitivity is automatically compensated through correction of a defective echo received based on the comparision. CONSTITUTION:A device is provided with a gate means, consisting of a gate setting circuit 24 extracting a surface wave echo of a sample 2 detected by a probe 10, and a correcting means which corrects a defective echo based on a correction signal frm a sensitivity compensating circuit 25. The surface wave echo of the surface wave 3 detected by the probe 10 is compared with a surface wave echo serving as a reference, a sensitivity is automatically corrected through correction of a defective echo received based on the comparision, and this permits a flaw detecting precision to be maintained in a constant manner. |
