发明名称 |
SECONDARY ION MASS SPECTROMETRY |
摘要 |
PURPOSE:To improve analytical sensitivity and accuracy by synchronizing preselected mass sweep quantity of electricity with the passing energy control quantity of electricity, guiding an ion to a detector in a required energy passing condition, and measuring it. CONSTITUTION:The mass sweep voltage 9 of a quadrupole mass spectrometer control power supply 8 and an energy filter applied voltage 11 are connected to each other with a controller 10 containing an n-channel relay circuit and are controlled. If the mass sweep voltage corresponding to the number of ion masses to be measured and their corresponding energy filter applied voltage are previously input to each channel, when the mass sweep voltage is applied to a quadrupole electrode 6, the energy filter applied voltage 11 is varied simultaneously through the controller 10 and the optimum ion measurement condition is obtained. |
申请公布号 |
JPS5868858(A) |
申请公布日期 |
1983.04.23 |
申请号 |
JP19810168031 |
申请日期 |
1981.10.21 |
申请人 |
MATSUSHITA DENKI SANGYO KK |
发明人 |
YOSHIOKA YOSHIAKI;KUSAO KENJI |
分类号 |
G01N23/225;G01N27/62;H01J49/26;H01J49/42 |
主分类号 |
G01N23/225 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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