发明名称 Auf Druck ansprechende Halbleitervorrichtung
摘要 In a semiconductor device with a four-layer structure having the so-called thyristor characteristic, when the control electrode for controlling its breakover voltage is constructed by the Schottky barrier and a means to apply a stress to the barrier, the breakover voltage of the said semiconductor device can be controlled by the stress. If this device is assembled in a circuit system, the circuit system can be set to either the "off" or "on" state, corresponding to the applied stress.
申请公布号 DE1961492(A1) 申请公布日期 1970.07.30
申请号 DE19691961492 申请日期 1969.12.08
申请人 MATSUSHITA ELECTRONICS CORP. 发明人 KANO,GOTA;YOKOZAWA,MASAMI;KAWASAKI,TATSUO;FUJIWARA,SHOHEI
分类号 G01L1/18;H01L21/00;H01L29/00;H01L29/84 主分类号 G01L1/18
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