发明名称 TESTING DEVICE FOR LOGICAL CIRCUIT
摘要 PURPOSE:To improve the reliability of test results, to minimize the cost and maintenance cost of a circuit testing device, and to point out a fault position, by providing a mechanism part which supports one probe and is movable to an optional position, and thus taking a test while a circuit to be tested is in actual- speed operation. CONSTITUTION:Observation points of a circuit board 1 to be tested are probed by a movable probe mechanism 2, whose measurement buffer output 12 is inputted to an encoder 3. On the basis of a clock signal 14 inputted to a measurement condition setting circuit 5 through a test pin, the encoder 3 supplies a wind signal and a clock signal 16 for operating the encoder 3 to the encoder 3. Encoded data 17 from the encoder 3 are compared in a microcomputer 6 with normal code data read out of a magnetic disk 8 to make a decision on its propriety. On the basis of circuit connection information read out similarly, a fault position is diagnosed by analyzing.
申请公布号 JPS5861475(A) 申请公布日期 1983.04.12
申请号 JP19810160172 申请日期 1981.10.09
申请人 HITACHI SEISAKUSHO KK 发明人 KAWAGUCHI IKUO
分类号 G01R31/28;G01R31/317;(IPC1-7):01R31/28 主分类号 G01R31/28
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