发明名称 DEFECT DETECTING CIRCUIT
摘要 PURPOSE:To suppress the variance of a threshold to detect defects accurately, by obtaining data, which follows up a texture level, from the image pickup signal of a face to be examined of a sheet material or the like by an up/down counter and inhibiting the counting during the blank period and the defect detection period. CONSTITUTION:An image pickup element 5 consisting of a CCD sensor or the like is controlled by a driving circuit 12 to scan optically the surface of an object to be examined repeatedly. A video signal VS which is outputted from the element 5 and is amplified by an amplifier 6 is compared with a threshold signal SH, which is obtained from an amplifier 15, in level by a defect discriminating comparator 16, and a binary discrimination output OUT is outputted. The output of an up/down counter 11 is given to a D/A converter 14, and the counter 11 is counted up for VS>b and is counted down for VS<b in accorddance with an output signal (c) of a comparator 7 by the output signal (b) of the converter 14, and the operation of the counter 11 is inhibited in the blank time between scannings of the element 5 and in the time when a defect is detected by the comparator 16. The signal (b) is amplified in the amplifier 15 to obtain the signal SH.
申请公布号 JPS5858448(A) 申请公布日期 1983.04.07
申请号 JP19810157189 申请日期 1981.10.02
申请人 TATEISHI DENKI KK 发明人 OGINO KENJI
分类号 G01N21/89;G01N21/88;G01N21/892;G01N21/93;(IPC1-7):01N21/88 主分类号 G01N21/89
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