TESTING CIRCUIT OF LARGE SCALE INTEGRATED CIRCUIT FOR ELECTRONIC CLOCK,申请号JP19810151162-传众专利搜索

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发明名称	TESTING CIRCUIT OF LARGE SCALE INTEGRATED CIRCUIT FOR ELECTRONIC CLOCK
摘要
申请公布号	JPS5852589(A)	申请公布日期	1983.03.28
申请号	JP19810151162	申请日期	1981.09.24
申请人	DAINI SEIKOSHA KK	发明人	YOSHIDA YOUSUKE
分类号	G01R31/28;G01R31/317;G01R31/3185;G04D7/00	主分类号	G01R31/28
代理机构		代理人
主权项
地址

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