发明名称 EPITAXIAL GROWTH METHOD OF AMORPHOUS SILICON OR POLYCRYSTALLINE SILICON ON WAFER
摘要 PURPOSE:To make the temperature control easy, by a method wherein tubular lamps with whole radiating ray varying at a moment in sequence are used as a heat source. CONSTITUTION:A wafer 8 is inserted in a heating furnace and lamps 100 in both planes are lit. After about 3-5sec, the wafer and alpha-Si layer are heated to 1,100-1,400 deg.C in nearly uniform distribution and held at the temperature. Only a lamp 100a at an end of the wafer in the plane S1 is lit by excessive input, and then a lamp at the right side is lit by excessive input in sequence. The alpha-Si layer attains temperature of 1,410-1,480 deg.C partially from the right side gradually. Epitaxial growth is effected at a temperature near the melting point of silicon, and if the heating to 1,410-1,480 deg.C is performed concurrently in the whole region for a long time, the wafer may be melted or warped. In such method of the invention, the wafer is neither damaged nor warped.
申请公布号 JPS5846621(A) 申请公布日期 1983.03.18
申请号 JP19810144693 申请日期 1981.09.16
申请人 USHIO DENKI KK 发明人 HIRAMOTO TATSUMI
分类号 H01L21/20;H01L21/26 主分类号 H01L21/20
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