发明名称 |
MANUFACTURE OF SILICON SUBSTRATE |
摘要 |
PURPOSE:To improve the hold time of an MOS memory IC by executing heat treatment at two stages of a high temperature and a low temperature to the specular Si substrate and removing a surface layer. CONSTITUTION:The P type Si substrate with a mirror surface is manufactured from a CZ non-dislocation single crystal containing the oxygen concentration of 14-18X10<17> atom/cc, treatment for 2hr at 1,150 deg.C and 8hr at 700 deg.C in Ar is executed to the substrate, and the surface layer is etched by approximately 0.5- 3mu. The hold time of the MOS memory is improved remarkably through the removal of the surface layer. |
申请公布号 |
JPS5844724(A) |
申请公布日期 |
1983.03.15 |
申请号 |
JP19810142334 |
申请日期 |
1981.09.11 |
申请人 |
KOMATSU DENSHI KINZOKU KK |
发明人 |
AKIYAMA NOBUYUKI;KOUNO MITSUO |
分类号 |
H01L21/02;H01L21/304;H01L21/322;H01L21/324;(IPC1-7):01L21/322 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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