| 摘要 |
A process is disclosed for the production of a MIS field effect transistor having an adjustable, extremely short channel length. The effective channel length is set by superimposing at least two implantation steps employing differing implantation energy and doses. A gate electrode which possesses vertically etched edges is used as an implantation mask for the source implantation and drain implantation. The process allows a MOS structure having an arbitrarily small effective channel length to be constructed by exploiting the lateral scattering which occurs during the ion implantation without influence by mask tolerances. The process corresponding to the theory of the invention provides the possibility of constructing a DIMOS-similar transistor having typical structural dimensions in the region of 1 mu m and less. |
