| 摘要 |
A multiprobe test system is disclosed for testing microcircuits which includes a printed circuit board having a plurality of data-detector probes attached for Z-axis control port body, and an arm supported by the body and attached thereto in an angular fashion. A probe tip in the form of a needle extends from and is attached to the arm. The probe tip includes a downwardly positioned point for contact with the surface having integrated circuits defined thereon.
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