发明名称 DETECTOR FOR DEFECT ON SURFACE OF MATERIAL
摘要 PURPOSE:To exclude a complicated circuit which checks the continuity, by using a mechanism that feeds the sheet type material at a constant speed, a 1-dimensional photoelectric conversion scanner that is attached vertically to the feeding direction of the above-mentioned material, and others. CONSTITUTION:A defect detector contains a feeding mechanism that feeds the sheet type material at a constant speed and a 1-dimensional photoelectric conversion scanner 10. The light reflected from a sheet material 6 which is irradiated evenly by a light source 8 is received at the scanner 10. Then the control signal that performs the scan control by means of the output signal of a rotary encoder 2 is produced along with the distance signal to the feeding direction of the material 6. In this case, the defect is detected with the surface signal level of the material 6 used as the reference signal by using a floating binary system. As a result, a complicated circuit required for the continuity is not required.
申请公布号 JPS5828653(A) 申请公布日期 1983.02.19
申请号 JP19810127065 申请日期 1981.08.13
申请人 NIPPON DENKI KK 发明人 YOKOI SADAAKI;SAKURAI YOSHIKI
分类号 G01N21/89;G01N21/892 主分类号 G01N21/89
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