发明名称 HIGH-TEMPERATURE DEVICE FOR SAMPLE
摘要 PURPOSE:To prevent burnout of a thermocouple, by using tungsten and graphite as a material of a thermocoupler. CONSTITUTION:Tungsten is used as a material of a thermocouple at a plus side and graphite at a minus side. The semiconductor thermocouple is used with temperature control for a high-temperature device for a sample.
申请公布号 JPS5821530(A) 申请公布日期 1983.02.08
申请号 JP19810121123 申请日期 1981.07.31
申请人 SUWA SEIKOSHA KK 发明人 OGUCHI TAMIO
分类号 G01N23/20;G01K7/02;G01K7/04 主分类号 G01N23/20
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