发明名称 TESTING DEVICE FOR TEMPERATURE
摘要 PURPOSE:To perform high temp./low temp. cycle tests automatically under programmed control and to improve the efficiency of the testing operations by setting the environmental conditions for testing the temp. of printed board units in a control section. CONSTITUTION:A function tester 1 for testing the functions of a printed board unit 23 wherein electronic parts, etc. are packaged on a printed board is provided with a thermal box 7 for covering the unit 23, a heat chamber 4 having a duct 4a for feeding of hot wind into the box 7, a cold chamber 5 having ducts 5a-5c for circulating cold wind in the box 7, and a control section 8 for controlling the chambers 4 and 5 selectively. The temp. of atmosphere in the box 7 is controlled to a required temp. by the selection of the chambers 4 and 5, whereby the unit 23 is tested.
申请公布号 JPS5821175(A) 申请公布日期 1983.02.07
申请号 JP19810119705 申请日期 1981.07.30
申请人 FUJITSU KK 发明人 KAWAI SHIGERU
分类号 G01R31/30;G01N17/00;G01R31/28 主分类号 G01R31/30
代理机构 代理人
主权项
地址