发明名称 ELECTRON BEAM EXPOSURE APPARATUS
摘要 PURPOSE:To make highly accurate position detection possible by using a magneswitch as a sample's origin position detector in an external deliverly means for driving a table, situated within an electron beam exposure room, on which a sample is placed. CONSTITUTION:In an external deliverly means for driving a sample table within an electron beam exposure room, upper and lower tables 5, 6 are installed on a bearing stand 9, and a bracket 10 with a ball screw nut 4 fixed to it is situated above the tables. Rotating a ball screw jig 3 by a motor 11 through a coupling 12 can reciprocate the ball screw nut 4, the bracket 10, the upper table 5, a magnet 1, and a moving bar 7 as one united body, as indicated by the arrow A. When the magnet 1 passes by a detector head 2 a signal (giving an origin position) is issued. A magneswitch, which is a high precision non-contact position detector, detects magnetic flux of the magnet 1 in a vertical direction and outputs a DC voltage proportional to the flux.
申请公布号 JPS5816526(A) 申请公布日期 1983.01.31
申请号 JP19810113515 申请日期 1981.07.22
申请人 TOKYO SHIBAURA DENKI KK 发明人 KUDOU AKIRA
分类号 H01L21/027;H01J37/34 主分类号 H01L21/027
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