发明名称 LIFE TESTING CIRCUIT UNDER ALTERNATING-CURRENT FEEDING
摘要 PURPOSE:To flow constant currents to samples and to display the breaking of wire, by connecting the samples in series to an AC constant-current source, and providing bypass circuits and means of indicating that currents flow through the bypass circuits in parallel to the samples. CONSTITUTION:Samples 1 are connected in series and further connected to an AC constant-current source 3. A reed relay 4, a photothyristor coupler 6, and a trigger diode 5 are connected to each sample 1. To the photothyristor of each coupler 6, an LED7 for display is connected in series. If the breaking of wire occurs to some sample 1, the corresponding trigger diode 5 turns on, the relay 4 is closed to form a bypass circuit for the faulty sample, the LED7 is turned on to display the faulty sample.
申请公布号 JPS5811877(A) 申请公布日期 1983.01.22
申请号 JP19810109313 申请日期 1981.07.15
申请人 HITACHI SEISAKUSHO KK 发明人 KAIZUKA TAKANORI
分类号 G01R31/30;G01R31/02 主分类号 G01R31/30
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