发明名称 INSPECTING DEVICE FOR SUBSTRATE
摘要 PURPOSE:To decide arbitrary patterns automatically and accurately by processing the image information read by an image sensor with a microcomputer. CONSTITUTION:In a sensor part 100, the patterns on a substrate 1 are made into image information by means of a sensor 2 driven by a driving circuit 3 and a roller 7 driven by a motor 6 and this information is read into a CPU5 via an AD converter 4. The original picture which is read first is stored in a hard disc 12, and the position reference and inspection area of the original picture are assigned by the operation of a master CPU9. While viewing a part of the specimen on a display 14, the operator enlarges said patterns with a slave system 500 and erases pinholes alpha and pattern cuts beta, then the patterns are reduced and the defective parts are detected by arithmetic operations.
申请公布号 JPS589009(A) 申请公布日期 1983.01.19
申请号 JP19810107871 申请日期 1981.07.10
申请人 MITSUBISHI DENKI KK 发明人 SUGIE HIROSHI;ARAI TOORU;TAKAHASHI OSAMU
分类号 G01R31/02;G01B11/24;G06K9/36;G06T1/00 主分类号 G01R31/02
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