发明名称 SELECTIVE ANALYZING METHOD FOR SEPARATE TRACE QUANTITY COMPONENT IN GAS AND LIQUID
摘要 The analysis comprises first enriching the component to be determined (target component) by contacting an non porous solid surface with the gas or the liquid to be investigated and depositing the target component from the gaseous or liquid phase onto the solid surface in the range of a monolayer preferably within the first monolayer. The deposition is effected by absorbing the target component either directly or in the form of a derivative product, which can then be detected by introducing the solid surface with the enriched target component into a mass spectrometer. Surface sensitive mass analyzers, such as secondary ion mass spectrometers or laser activated mass analyzers, have been proven successful.
申请公布号 JPS589040(A) 申请公布日期 1983.01.19
申请号 JP19820109162 申请日期 1982.06.26
申请人 BAYER AG 发明人 ARUFUREETO BENINGUHOOBEN;GIYUNTAA KENPUFU;RAIMAA HORUMU
分类号 G01N23/225;G01N1/22;G01N27/62;G01N33/52;H01J49/10;H01J49/26 主分类号 G01N23/225
代理机构 代理人
主权项
地址