发明名称 OBJECTIVE LENS FOR SCANNING ELECTRON MICROSCOPES
摘要 PURPOSE:To obtain an image capable of being highly resolved, by reducing a coefficient of shperical aberration of the objective lens. CONSTITUTION:Two auxiliary magnetic pole pieces 19, 20 are installed to an upper magnetic pole piece 3 by using spacers 13, 21 and binding members 15, 22. A single composite magnetic field can be obtained by three gaps among the magnetic poles. A total sum G2 of gaps among each neighboring magneitc pole pieces existing in an upper half region between upper and lower magnetic pole pieces 3, 4 is arranged less than 1.5 times the total sum G1 of gaps among each neighboring magnetic pole pieces existing in a lower half region between the upper and lower magnetic pole pieces 3, 4.
申请公布号 JPS55144639(A) 申请公布日期 1980.11.11
申请号 JP19790053226 申请日期 1979.04.28
申请人 NIPPON ELECTRON OPTICS LAB 发明人 NAKAGAWA SEIICHI
分类号 H01J37/141;H01J37/14;(IPC1-7):01J37/14 主分类号 H01J37/141
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