| 摘要 |
PCT No. PCT/CH79/00099 Sec. 371 Date Aug. 27, 1980 Sec. 102(e) Date Aug. 27, 1980 PCT Filed Jul. 13, 1979 PCT Pub. No. WO80/01442 PCT Pub. Date Jul. 10, 1980.A monitoring system with an optical sensor for the detection of interference arcs in electrical systems, particularly in enclosed SF6-insulated high voltage systems. The system improves the reliability of the sensor by means of a test light impulse supplied from outside the enclosure by examining the exit surface as well as the entry surface on the sensor for the light beam for turbidity by means of a light-diffusing coating on the surface. To that end, the sensor has at least a second photoconductor with an external light source for the production of test light impulses and the test light impulse is led through a portion of the space to be monitored before it enters again into the sensor and the first photoconductor.
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