| 摘要 |
PURPOSE:To eliminate the setting mistake to increase the using efficiency of a memory shelf and at the same time to obtain a memory testing method of high efficiency, by carrying out a setting operation of the switch information when a card is tested with an automatic use of the information on a card to be tested. CONSTITUTION:The address writing data, reading and writing signals 30 and 31, and a card selection signal 32 are fed to a memory card 10 to be tested from an address data control circuit 21 provided in a tester 20. A testing circuit provided to each card 10 at the moment of designing delivers the card forming information which is set at a production mode of the card 10 only when the signal 32 is received. In such way, the number of address bits, timing, etc. are automatically set. Thus the memory cards of different types can be continuously tested. |
