发明名称 DETECTING SYSTEM FOR FAULTY AREA OF MEMORY DEVICE
摘要 PURPOSE:To ensure the discrimination for the faulty areas with each card, by providing effectively a checking function of an error which causes a plural- bit error within a memory card and at a memory control part respectively. CONSTITUTION:For instance, two memory cards are used with their memory array parts working simultaneously, and these two cards form a memory block. The check signals *MAE (M) and *TME (M) of a memory address checking circuit and a timing checking circuit which are provided within the memory card are fed to a logging register LGR. At the same time, the check result signals MAE (C), CSE and TME (C) of the memory address checker MACH (C), selection signal checker CSCH and timing checker TMCH (M) provided at a memory control part are also fed to the register LGR. The register LGR transmits an error informing signal ERR and an error data ERDT when an error arises. Then the faulty area is discriminated through the analysis of the data ERDT.
申请公布号 JPS581897(A) 申请公布日期 1983.01.07
申请号 JP19810098555 申请日期 1981.06.25
申请人 FUJITSU KK 发明人 YAMADA TOYOSHI;AIDA KOUICHI
分类号 G06F12/16;G11C29/04 主分类号 G06F12/16
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