发明名称 TESTING METHOD OF THERMAL HEAD
摘要 PURPOSE:To reduce a production cost, by making a pulse current flow to a heating printing element before forming a protective film, screening a head by a variation rate of an element resistance value, and removing a defect at an early state. CONSTITUTION:In a thermal head consisting of a picture element type printing heating element array, at the state where pattern formation of an electrode 4 and 5 has been completed, a series of pulses 11 for screening are applied to a printing dot 3 by a pulse generating device 10, and are heated. Subsequently, before and after said pulse is applied, a resistance value of a dot element is inspected, and its quality is decided. According to such a constitution, a contingent defect caused by a patterning error of a head substrate, etc. is removed by a simple means, therefore, not only the number of man-hour of a flow process but also waste of a production material are removed entirely, and a production cost can be reduced.
申请公布号 JPS58765(A) 申请公布日期 1983.01.05
申请号 JP19810099279 申请日期 1981.06.26
申请人 FUJITSU KK 发明人 TANMACHI HARUO;TERAJIMA MINORU
分类号 G01R31/00;(IPC1-7):01R31/00 主分类号 G01R31/00
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