| 摘要 |
PURPOSE:To enable the effective, rapid and stable detection of presence or absence of a defect by individually detecting a voltage period and a voltage waveform width produced by the commutation of SCR group and diode group by a voltage period detecting system and voltage waveform width detecting system. CONSTITUTION:This device has FF circuits 7, 8, AND gates 91-93 and 131- 133, OR gates 101-102, 14, and period detecters 111, 112 and 121, 122. The period detectors detect the period of induced voltage of a detecting coil produced by the commutation of SCR and diode. This device also has an NOT gate 15, a waveform shaper 16, a setter 18 for setting the width of a reference voltage waveform, and a voltage waveform width detector 17 for detecting the width of the induced voltage waveform of the detecting coil produced by the commutation of the SCR and diode. In a period detecting system, the pulse width is monitored by the respective period detectors 11, 12 and 121, 122, and the detected pulse width is made to be compared with the set reference pulse width. |
