| 摘要 |
PURPOSE:To measure vaporized quantity of stored low temperature liquid simply, by keeping the inner pressure of a low temperature tank higher than saturated vapor pressure of said liquid for a controlled time and measuring a rate of temperature elevation of said liquid during that time. CONSTITUTION:The inner pressure of a tank is maintaied under the pressure Po higher than the saturated vapor pressure of stored liquid from the initial conditions of an inner pressure Ps, a temperature of a liquid layer T and the liquid face W at the normal time in a low temperature tank. Next, a term not having a loss of weight DELTAW of the liquid face of the tank is presumed as a measuring term of vaporized quantity X and a rate of a rise in temperature DELTAT of this term X is measured. An invasion quantity of heat (q) is found by an expression q=CXTXW by using this rate DELTAT, the quantity of stored liquid W and a specific heat of liquefied gas C. Further, a vaporized quantity beta is found by an expression L=qX100/WXL by using latent heat of the liquefied gas L. Hereby, the quantity of vaporized gas is measured only by measuring a portion of the rise in temperature of the stored liquid without measuring the quantity of the vaporized gas directly. |
