INTEGRATED CIRCUIT ARRANGEMENT IN MOS- TECHNOLOGY WITH FIELD EFFECT TRANSISTORS

摘要

1 PHD. 79-011. During the fabrication of integrated circuits testing is necessary in order to enable faults to be located. For this purpose it is known to connect test points to specific points of the circuit, which during fabrication are accessible with a suitable designed scanner. Owing to the location of the test points smaller blocks are formed in comparison with the complete circuit arrangement. According to the invention transistor switched are included to provide isolation of selected input and output transistor blocks to allow separate testing as well as testing in combination.