发明名称 |
Förfarande för testning av integrerade kretsar som är monterade på en bärare |
摘要 |
A method of testing an interconnection function between two integrated circuits which are mounted on a carrier and which are interconnected by data connections, for example a printed wiring board, is disclosed. The integrated circuits are also connected to a serial bus via which test patterns and result patterns can be communicated between a test device which can be connected thereto and the respective integrated circuits. The bus of a preferred embodiment is formed by a so-called I2C bus. In a further elaboration, this set-up can also be used for testing the internal logic circuitry of the integrated circuits. For the testing of the interconnection function, input/output cells with a parallel connection for performing the normal execution function in a transparent mode are provided. They also include series connections for communication test/result patterns by way of a shift register. |
申请公布号 |
SE469995(B) |
申请公布日期 |
1993.10.18 |
申请号 |
SE19860003749 |
申请日期 |
1986.09.08 |
申请人 |
NV PHILIPS' GLOEILAMPENFABRIEKEN |
发明人 |
W A *SAUERWALD;J *DE WILDE;K J E *VAN EERDEWIJK;F P M *BEENKER;M T M *SEGERS |
分类号 |
G01R31/28;G01R31/3185;(IPC1-7):G06F11/26 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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