发明名称 Semiconductor device and method of manufacturing the same
摘要 This invention relates to a semiconductor device which comprises a monocrystalline silicon substrate, a first insulating film formed in a first region on one major surface of the monocrystalline silicon substrate, a first monocrystalline silicon layer formed on the first insulating film, a second insulating film covering a side surface of the first monocrystalline silicon layer, a first polysilicon layer formed to cause a side surface of the first polysilicon layer to contact the second insulating film, and a second monocrystalline silicon layer, having a side surface contacts the first polysilicon layer, formed in a second region of the one major surface of the monocrystalline silicon substrate, and dielectrically isolated from the first monocrystalline silicon layer, and a method of manufacturing the same.
申请公布号 US5476809(A) 申请公布日期 1995.12.19
申请号 US19940242085 申请日期 1994.05.13
申请人 NEC CORPORATION 发明人 KOBAYASHI, KENYA
分类号 H01L21/76;H01L21/762;H01L21/8238;H01L21/8249;H01L27/06;H01L27/08;H01L27/092;H01L29/78;(IPC1-7):H01L21/76 主分类号 H01L21/76
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