发明名称 Method of separation of individual components in an integrated circuit - including application to CMOS transistors
摘要 <p>Procedure for sepn. between elementary components in an integrated circuit comprises (a) coating the surface of silicon with a masking layer which is insensitive to thermal oxidn.; (b) forming channels in the silicon through the masking layer of about 1 micron width and a greater depth; (c) thermal oxidising until the silica formed re-closes the channels. In partic. in a bipolar integrated circuit a channel is obtd. of a different conductivity from the 'boxes' it includes; in a MOS integrated circuit the channel has a depth greater than the deepest diffusion to form the MOS transistors; in a SSI integrated circuit the channel has a depth equal to the thickness of the silicon layer deposed on the insulating substrate.</p>
申请公布号 FR2507013(A1) 申请公布日期 1982.12.03
申请号 FR19810010897 申请日期 1981.06.02
申请人 EFCIS 发明人 YVON GRIS ET MICHEL MONTIER
分类号 H01L21/033;H01L21/308;H01L21/762;H01L21/8238;(IPC1-7):01L21/76;01L29/78;01L27/06 主分类号 H01L21/033
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