发明名称 |
Method of separation of individual components in an integrated circuit - including application to CMOS transistors |
摘要 |
<p>Procedure for sepn. between elementary components in an integrated circuit comprises (a) coating the surface of silicon with a masking layer which is insensitive to thermal oxidn.; (b) forming channels in the silicon through the masking layer of about 1 micron width and a greater depth; (c) thermal oxidising until the silica formed re-closes the channels. In partic. in a bipolar integrated circuit a channel is obtd. of a different conductivity from the 'boxes' it includes; in a MOS integrated circuit the channel has a depth greater than the deepest diffusion to form the MOS transistors; in a SSI integrated circuit the channel has a depth equal to the thickness of the silicon layer deposed on the insulating substrate.</p> |
申请公布号 |
FR2507013(A1) |
申请公布日期 |
1982.12.03 |
申请号 |
FR19810010897 |
申请日期 |
1981.06.02 |
申请人 |
EFCIS |
发明人 |
YVON GRIS ET MICHEL MONTIER |
分类号 |
H01L21/033;H01L21/308;H01L21/762;H01L21/8238;(IPC1-7):01L21/76;01L29/78;01L27/06 |
主分类号 |
H01L21/033 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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