| 摘要 |
PURPOSE:To measure the film thickness of both sides, by irradiating X-rays on a plane A or B of a material to be measured on which a magnetic substance layer is formed for the planes A and B of a thin high polymer base, measuring the intensity of fluorescent X-rays on both the sides are processing the result. CONSTITUTION:To a material to be measured 9 such as a floppy disc where both sides of a base film P such as polyester are formed with a magnetic substance layer, X-rays are irradiated from a radiation source 1 with a constant angle alpha, and the fluorescent X-rays from both the sides irradiated with a constant visual angle are detected at a detector 2. The output is given to a compensating operation circuit 6 via an amplifier 3, a peak wave analyzer 4, and a counting circuit 5. In the operating circuit 6, film thicknesses tA and tB are calculated with an intensity of irradiated X-ray IOE, intensities of fluroescent X- ray on the planes A and B, IAA, IBB, IAB and IBA, angles alpha, beta, and absorbing coefficient between the base film and the magnetic substance layer, and the result is displayed on the displays 7 and 8. |
