| 摘要 |
PURPOSE:To facilitate repairing and exchanging of contact pains and to permit easy high temp. screening by providing a probe ring provided with contact pins and a probe card provided with a test circuit separably. CONSTITUTION:After the pins 25 secured to a probe ring 21 are fitted into the connecting and fitting holes 19 of a female connector 18, an electronic part to be tested is placed on the ring 21. The electronic part is pressed by a pressing body from top to bottom, and the connecting terminals thereof contact with the pins 25, by which the electronic part and the ring 21 are conducted. The electronic part is flowed with test circuit currents through the ring 21 and is subjected to prescribed tests. In the case of repairing or exchaning the pins 25 of the ring 21, the ring 21 is pulled upward and is removed from the female connector 18 of the card 16. Since the ring alone can be repaired and exchanged, the maintenance work is extremely easy. |
